Imaging in liquid
Most of the high resolution images we collect are taken at ideal imaging conditions: in a vacuum chamber to keep everything clean, with the sample at low temperature so that we can scan slowly. But this isn't ideal for every sample - especially biological samples like cells and proteins.
I love the idea of taking our knowledge of atomic-resolution AFM and applying it to device-relevant and biologically-relevant conditions. We often have to rely on collaborators who understand the samples better than we do and can help guide us with the preparation.
D. Kirpal, K. Pürckhauer, A. J. Weymouth and F. J. Giessibl. Ion mobility and material transport on KBr in air as a function of the relative humidity. Beilstein J. Nanotechnology 10, 2084 (2019)
K. Pürckhauer, D. Kirpal, A.J. Weymouth, F.J. Giessibl. Analysis of Airborne Contamination on Transition Metal Dichalcogenides with Atomic Force Microscopy Revealing That Sulfur Is the Preferred Chalcogen Atom for Devices Made in Ambient Conditions. ACS Appl. Nano Mater. 2, 2593 (2019)
A.J. Weymouth, D. Wastl, F.J. Giessibl. Advances in AFM: Seeing Atoms in Ambient Conditions. E-J Surf. Sci. Nanotechnology. 16, 351 (2018)
K. Pürckhauer, A.J. Weymouth, K. Pfeffer, L. Kullmann, E. Mulvihill, M.P. Krahn, D.J. Müller and F.J. Giessibl. Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors. Sci. Rep. 8, 9330 (2018)
H. Ooe, D. Kirpal, D.S. Wastl, A.J. Weymouth, T. Arai, and F.J. Giessibl. Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy. Appl. Phys. Lett. 109, 141603 (2016)
D. S. Wastl, M. Judmann, A.J. Weymouth and F. J. Giessibl. Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy using qPlus Sensors with Sapphire Tips. ACS Nano 9, 3858 (2015)
D. S. Wastl, A. J. Weymouth and F. J. Giessibl. Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy. ACS Nano 8, 5233 (2014)
D. S. Wastl, A. J. Weymouth, and F. J. Giessibl. Optimizing atomic resolution of force microscopy in ambient conditions. Phys. Rev. B, 87, 245415 (2013)